Gurgen E. Harutyunyan
Biography
Education
2005 - 2008: Yerevan State University, Faculty of Informatics and Applied Mathematics, PhD in technical sciences
2003 - 2005: Yerevan State University, Faculty of Informatics and Applied Mathematics, Master degree
1999 - 2003: Yerevan State University, Faculty of Informatics and Applied Mathematics, Bachelor degree
1998 - 1999: College of city Abovyan
1994 - 1998: School N2, city Abovyan
1989 - 1994: School N10, city Abovyan
PhD in technical sciences, 2008, Yerevan State University

Work Experience
2010 - 2012: Synopsys, Senior engineer
2004 - 2010: Virage Logic, Senior engineer
2000 - 2004: Yerevan State University, programmer

Research interest
Testing memory devices
The list of scientific works is attached

Awards
TTTC/ITC Commemorative Gerald W. Gordon Award for Student Volunteer Service, International Test Conference (ITC), USA, 2008
Best student presentation in IEEE East-West Design and Test Workshop, Russia, 2006

Languages
Armenian, Russian, English

Gurgen E. Harutyunyan

Assistant | YSU Information Technologies Educational and Research Center - Chair of Information Systems
 
 

Article

G. Harutyunyan, S. Martirosyan, S. Shoukourian, Y. Zorian

Memory Physical Aware Multi-Level Fault Diagnosis Flow | IEEE Transactions on Emerging Topics in Computing, VOLUME 8, NO. 3, JULY-SEPT. 2020, pp.700-711

S. Shoukourian, G. Harutyunyan, Y. Zorian

Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2019, Volume 38, Number 3, 562-575 էջ

S. Shoukourian, G. Harutyunyan, G. Tshagharyan

Security Issues in Test and Repair Infrastructure for Systems-on-Chip | Информационно-коммуникационные технологии в науке, производстве и образовании ICIT-2017. 2017, стр. 114-122 |

D. Sargsyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

Automated flow for test pattern creation for IPs in SoC | EWDTS. 2017: 21-24 pp |

S. Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian

An efficient testing methodology for embedded flash memories | EWDTS. 2017: 422-425 pp |
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Patent

Hayk Grigoryan, Grigor Tshagharyan, Gurgen Harutyunyan, Samvel Shoukourian, Samvel Shoukourian, Yervant Zorian

DETECTION OF ADDRESS ERRORS IN MEMORY DEVICES USING MULTI-SEGMENT ERROR DETECTION CODES | Patent No.: US 11/023,310, Date of Patent: June 1, 2021, Appl. No. 16/549,419, filed on August 23, 2019. Hayk Grigoryan, Grigor Tshagharyan, Gurgen Harutyunyan, Samvel Shoukourian, Yervant Zorian

Aram Hakhumyan, Gurgen Harutyunyan, Samvel Shoukourian, Valery Vardanian, Yervant Zorian

Testing electronic memories based on fault and test algorithm periodicity | SYNOPSYS, INC. (Mountain View, CA). 9831000. Nov 28, 2017
 

Thesis

H. Grigoryan, G. Harutyunyan, S.Shoukourian, V. Vardanian, Y. Zorian

“Minimal Algorithms for Testing Content-Addressable Memories” | In proc. of IEEE East-West Design & Test Symposium 2010, St. Petersburg, Russia, September 17-20, 2010