Zielinska-Rohozinska E., Regulska M., Harutyunyan V. S., Pakula K., Borowski J.
High resolution x-ray diffraction defect structure characterization in Si-doped and undoped GaN films
| Materials Science and Engineering B91-92, p. 441 (2002)
X-Ray Diffraction Investigations of F Doping Effect on the Structure of Polycrystalline SrTiO3
| Proceedings of National Academy of Science of Armenia, series Physics, 37, No. 1, p. 44 (2002)
High Resolution X-Ray Diffraction Strain-Stress Analysis of GaN/Sapphire Heterostructures
| Journal of Physics D: Applied Physics 34, p. A1 (2001)
Microstrain distribution in calcium hydroxide present in the interfacial transition zone
| Cement and Concrete Research 30, p. 709-713 (2000)
The X-Ray Diffraction of a Bicrystal with Narrow Plate-Shaped Nondiffracting Zone
| Acta Crystallographica A 53, p. 407 (1997)
