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Публикации
Статья
An Extended Efficient Algorithm of Pattern Matching for Partially Commutative Monoids
Статья
LEARNING METHODOLOGY FOR VALIDATION OF MEMORY BIST SOLUTIONS VIA A SHARED INTERFACE
Статья
Results of Validation Analysis for Multi-Memory Bus BIST Engines
Статья
Repair of Resistive Open Defects on Word-Lines and Bit-Lines of SRAMs
Статья
An Approach for Increasing Memory Repair Efficiency
Статья
Analytics for AI Related Applications of Multidimensional Multitape Finite Automata
Статья
Functional Safety Compliant Test & Repair Framework for System-on-Chip Lifecycle Management
Патент
DETECTION OF ADDRESS ERRORS IN MEMORY DEVICES USING MULTI-SEGMENT ERROR DETECTION CODES
2021
Статья
Polynomial algorithm for equivalence problem of deterministic multitape finite automata
Статья
Memory Physical Aware Multi-Level Fault Diagnosis Flow
Статья
Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism
Конференция
Armenia: Communicating to World Community in Electronic Test and Design
2019
1-3
Патент
FINFET-BASED MEMORY TESTING USING MULTIPLE READ OPERATIONS
2019
Статья
Experimental study on Hamming and Hsiao Codes in the Context of Embedded Applications
Статья
Automated Flow for Test Pattern Creation for IPs in SoC
Статья
An Efficient Testing Methodology for Embedded Flash Memories
Статья
Security Issues in Test and Repair Infrastructure for Systems-on-Chip
Патент
Testing Electronic Memories Based on Fault and Test Algorithm Periodicity
2017
Конференция
Securing Test Infrastructure of System-on-Chips
2016
29-32
Конференция
An efficient approach for memory repair by reducing the number of spares.
2015
21-25
