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ArticleFault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism
ArticleExperimental study on Hamming and Hsiao Codes in the Context of Embedded Applications
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ConferenceExtending fault periodicity table for testing faults in memories under 20nm.
ConferenceA power based memory BIST grouping methodology.
ConferenceOverview study on fault modeling and test methodology development for FinFET-based memories.
PatentTesting Electronic Memories Based on Fault and Test Algorithm Periodicity
PatentFINFET-BASED MEMORY TESTING USING MULTIPLE READ OPERATIONS
PatentDETECTION OF ADDRESS ERRORS IN MEMORY DEVICES USING MULTI-SEGMENT ERROR DETECTION CODES